Chemistry Division

Interfacial/Surface Analysis

X-Ray Photoelectron Spectroscopy (point, mapping), Auger Electron Spectroscopy, Electron Stimulated Desorption, Secondary Electron Microscopy and Low Energy Electron Source, Thermal Desorption RGA

Analytical instruments which can characterize interfacial chemical properties and reactivity are valuable tools in the determination of aging mechanisms of polymeric materials.  State-of-the-art electron spectroscopies and microscopies (XPS, AES, SEM) can be used to straightforwardly determine the changes in chemical composition, chemical bonding, and surface morphology of polymers as a function of temperature, age, or radiation exposure.  Specifically, our new imaging XPS capability enables facile characterization of polymeric materials with spatial resolution down to 10 mm or better.  Additional vacuum-based interfacial science techniques are also useful in the study of polymers.  Electron stimulated desorption can investigate mechanisms of interfacial chemistry stimulated by radiation exposure.  Gas-phase characterization by mass spectrometry is useful in determining mechanisms of polymer degradation, evolution of undesired gas-phase reaction products, or reaction with gas-phase impurities vs. time and/or temperature. Each of these techniques can be employed in situ, i.e., in the presence of gas-phase additives, at temperature, in proximity to radiation sources if advantageous.  Specifically, applied interfacial studies are useful in the determination of chemical interactions that may lead to changes in the physical parameters (density, elasticity, evolution of gases, adhesion) of polymer materials.  These techniques can directly compare the chemical properties and reactivity of old vs. new materials, and characterize surface impurities or reaction products that cause poor material performance.
Contact: Dan Kelly (505) 665-7388

Optical Microscopy

We have several light microscopes with bright field, DIC, and fluorescence capabilities (Zeiss Axiophot, Axioplan, Axioskop, Axiovert) with low-light imaging cameras (Roper Scientific) (TA43/20).
Contact: Tom Yoshida (505) 665-0342

Confocal MXRF

3D nondestructive, spatially resolved elemental analysis, track elemental or density at interfaces, from 10’s of micrometers to mm’s below the surface depending upon the analyte and matrix.

  • X-Ray Diffraction (XRD)
  • Micro X-Ray Tomography
  • Raman Spectroscopy (point, mapping)

Contact: George Havrilla (505) 667-9627

Micro FTIR

Cross sectional imaging and single point spectral data acquisition down to 20 micrometer Spot size.
Contact: George Havrilla (505) 667-9627

Micro X-ray Fluorescence

2D, nondestructive, spatially resolved elemental analysis – see MXRF under unique experimental section. Includes nanoparticles, biological, chemicals, polymers, thin films, layered materials, alloys, corrosion products, failure analyses, etc.
Contact: George Havrilla (505) 667-9627

February 2012

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